Title :
Target material characterization using high-order signal processing of ultra-wideband radar data
Author :
Marmarelis, Vasilis Z. ; Sheby, David ; Kisenwether, Elizabeth C. ; Erdley, Tood A.
Author_Institution :
Multispec Corp., Cherry Hill, NJ, USA
Abstract :
Results obtained by two high-order signal processing methods applied to ultrawideband (UWB) radar data in the UHF band are described. The UWB radar data were collected in a specially designed bistatic test range. Four types of UWB signals were used to test a metal (reference) plate, five different commercially available radar absorbing material samples with metal backing, and five natural material (clutter) samples. The objective was to assess the potential of the authors´ UWB signal modalities and associated signal processing techniques in extracting reliable and distinct characterizations of different target materials. Pseudorandom UWB radar waveforms were used, and the collected data were analyzed using two high-order spectral processing (HOSP) methods: bispectral analysis and Kernel analysis. The radar problem was cast in a black-box system identification context, allowing the interpretation of the obtained results as a system/target identifiers and the use of the HOSP techniques in this context. The preliminary results demonstrate the feasibility of this radar technology and processing methodology and provide intriguing possibilities in utilizing this approach for target/material characterizations
Keywords :
radar applications; signal processing; Kernel analysis; UHF band; bispectral analysis; bistatic test range; black-box system identification; high-order signal processing; metal backing; metal plate; pseudorandom radar waveforms; radar absorbing material; target material characterisation; ultrawideband radar data; Data analysis; Data mining; Inorganic materials; Materials reliability; Materials testing; Radar clutter; Radar signal processing; Signal processing; Ultra wideband radar; Ultra wideband technology;
Conference_Titel :
Telesystems Conference, 1992. NTC-92., National
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0554-X
DOI :
10.1109/NTC.1992.267898