DocumentCode :
1567666
Title :
High coercivity CoCrPt/Ti perpendicular media by in situ interdiffusion of CrMn ultra thin overlayers
Author :
Roy, A.G. ; Jeong, Sangkwon ; Laughlin, David E.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2002
Abstract :
Summary form only given. Several reports have been published on CoCrPt perpendicular media and the use of a Ti buffer layer. The challenge to improve coercivity and squareness of this type of media is still extensive. We have deposited Ti (x nm)/CoCrPt (30nm)/CrMn (y nm) films at different substrate temperatures for different x and y values. We have observed that (0001) texture of Ti is strongly dependent on substrate temperature and Ti thickness, which subsequently affects the texture of the CoCrPt layer. A Ti buffer layer thickness of 50nm and a substrate temperature of about 280/spl deg/C introduce the best texture in the CoCrPt layer. Introduction of a 3nm thick CrMn overlayer improves the coercivity of the film by more than two times. The magnetic and structural properties of the films with and without CrMn layer are discussed.
Keywords :
chemical interdiffusion; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; interface magnetism; manganese alloys; perpendicular magnetic recording; platinum alloys; texture; titanium; 280 degC; 3 nm; 50 nm; CoCrPt/Ti perpendicular media; CrMn ultra thin overlayers; Ti; Ti buffer layer; Ti thickness; Ti-CoCrPt-CrMn; high coercivity; interdiffusion; substrate temperature; texture; Annealing; Buffer layers; Coercive force; Glass; Hysteresis; Memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1001003
Filename :
1001003
Link To Document :
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