DocumentCode :
1567744
Title :
GE high density interconnect: a solution to the system interconnect problem
Author :
Adler, M.
Author_Institution :
General Electric Corp. Res. & Dev., Schenectady, NY
fYear :
1992
Firstpage :
42675
Lastpage :
42678
Abstract :
It is noted that the General Electric high density interconnect (GE-HDI) is an excellent solution to the digital multichip packaging problem, and it offers solutions to other difficult system interconnect problems in analog power, microwave, display, and sensors. GE-HDI offers the closest hybrid solution to wafer scale integration, achieving the benefits of performance and density without the limitations and yield problems of the monolithic approach. Relative to other hybrid applications, it offers significant advantages in performance and anticipated reliability due to its sputtered metal interconnection and excellent thermal properties while not sacrificing density or cost. Maskless adaptive lithography allows for rapid prototyping and flexibility in design and debugging. With the complete absence of tooling for mask or tape bonding, NRE costs are the lowest of any multichip module technology. HDI also requires the fewest processing steps, because there is no need to mount die on tape or to do lead or die bumping
Keywords :
hybrid integrated circuits; multichip modules; GE high density interconnect; digital multichip packaging; hybrid applications; maskless adaptive lithography; multichip module technology; sputtered metal interconnection; Costs; Displays; Lithography; Microwave sensors; Packaging; Power system interconnection; Power system reliability; Rapid thermal processing; Sensor systems; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Telesystems Conference, 1992. NTC-92., National
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0554-X
Type :
conf
DOI :
10.1109/NTC.1992.267906
Filename :
267906
Link To Document :
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