DocumentCode
1567744
Title
GE high density interconnect: a solution to the system interconnect problem
Author
Adler, M.
Author_Institution
General Electric Corp. Res. & Dev., Schenectady, NY
fYear
1992
Firstpage
42675
Lastpage
42678
Abstract
It is noted that the General Electric high density interconnect (GE-HDI) is an excellent solution to the digital multichip packaging problem, and it offers solutions to other difficult system interconnect problems in analog power, microwave, display, and sensors. GE-HDI offers the closest hybrid solution to wafer scale integration, achieving the benefits of performance and density without the limitations and yield problems of the monolithic approach. Relative to other hybrid applications, it offers significant advantages in performance and anticipated reliability due to its sputtered metal interconnection and excellent thermal properties while not sacrificing density or cost. Maskless adaptive lithography allows for rapid prototyping and flexibility in design and debugging. With the complete absence of tooling for mask or tape bonding, NRE costs are the lowest of any multichip module technology. HDI also requires the fewest processing steps, because there is no need to mount die on tape or to do lead or die bumping
Keywords
hybrid integrated circuits; multichip modules; GE high density interconnect; digital multichip packaging; hybrid applications; maskless adaptive lithography; multichip module technology; sputtered metal interconnection; Costs; Displays; Lithography; Microwave sensors; Packaging; Power system interconnection; Power system reliability; Rapid thermal processing; Sensor systems; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Telesystems Conference, 1992. NTC-92., National
Conference_Location
Washington, DC
Print_ISBN
0-7803-0554-X
Type
conf
DOI
10.1109/NTC.1992.267906
Filename
267906
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