Title :
Low Dose Rate Testing of the Intersil IS1009RH Hardened Voltage Reference and ISL72991RH Negative Low Dropout Regulator
Author :
van Vonno, N.W. ; Gill, J.S.
Author_Institution :
Intersil Corp., Melbourne
Abstract :
We report results of baseline 100 krad(Si) low dose rate testing of the Intersil IS1009RH hardened voltage reference and ISL72991RH negative low dropout regulator. Both parts showed minimal to moderate sensitivity to this environment.
Keywords :
dosimetry; radiation effects; semiconductor device testing; voltage regulators; ISL72991RH negative low dropout regulator; Intersil IS1009RH hardened voltage reference; low dose rate testing; radiation sensitivity; Analog integrated circuits; Circuit testing; Dielectrics; Fixtures; Performance evaluation; Qualifications; Regulators; Semiconductor device testing; Telephony; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342548
