Title :
ELDRS Study of the LT-1078 for Multiple Applications
Author :
Love, David P. ; Faul, Jonathan ; Behrens, David ; Peterson, Chris ; Parkinson, James
Author_Institution :
Northrop Grumman Corp., Azusa
Abstract :
Sample LT1078 Op-Amps in five flight biases, including unpowered backup redundancy, underwent ELDRS hardness assurance testing. Application-unique electrical parameters were PSPICE modeled against dose predictions vs. available shielding.
Keywords :
SPICE; analogue integrated circuits; dosimetry; integrated circuit modelling; operational amplifiers; radiation hardening (electronics); shielding; ELDRS study; LT-1078 op-amps; PSPICE; application-unique electrical parameters; dose predictions; enhanced low dose-rate sensitivity; hardness assurance testing; radiation shielding; unpowered backup redundancy; Analog integrated circuits; Bipolar transistor circuits; Circuit testing; Degradation; Integrated circuit testing; Manufacturing; Operational amplifiers; Redundancy; Risk management; Robustness;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342549
