Title :
Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method
Author :
Kruckmeyer, Kirby ; Rennie, Robert L. ; Ostenberg, Dawn H. ; Ramachandran, Vishwanath ; Hossain, Tareq
Author_Institution :
Nat. Semicond., Santa Clara
Abstract :
Typically, single event upset (SEU) testing of analog to digital converters (ADC) has been done with static inputs. A test method, using a beat frequency and code error detection software, is presented. This test method allows for SEU characterization of ultra high speed ADC´s, using dynamic inputs that more closely reflect the operating conditions in a space application. The test method is demonstrated on National Semiconductor´s ADC08D1000WG-QV at 1 gigasample per second (GSPS) and an input frequency close to 1 GHz. A discussion of the SEU signatures and error rates are also presented.
Keywords :
UHF devices; aerospace components; aerospace testing; analogue-digital conversion; error detection; ion beam effects; very high speed integrated circuits; National Semiconductor´s ADC08D1000WG-QV; SEU signatures; analog to digital converters; beat frequency test method; code error detection software; error rates; single event upset characterization; space application; ultra high speed ADC; Analog-digital conversion; Application software; Clocks; Error analysis; Feeds; Frequency conversion; Semiconductor device testing; Single event upset; Software testing; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342550
