DocumentCode :
1568170
Title :
Research on electrostatic between metallic particle and semiconductor matrixes
Author :
Yu, Gefei
Author_Institution :
Res. Sect. of EMC & Electrostatics, Shanghai Maritime Univ., Shanghai, China
fYear :
2009
Abstract :
By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs2O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs2O of previous research. Ag-Cs2O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.
Keywords :
caesium compounds; semiconductor materials; semiconductor-metal boundaries; silver; Ag-Cs2O; charging; electrical characters; electrostatic characters; metallic particle; semiconductor matrixes; Conductors; Electric variables measurement; Electromagnetic compatibility; Electrons; Electrostatic measurements; Instruments; Neodymium; Particle measurements; Plasma density; Space charge; charging; electrostatics; matrixes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
Type :
conf
DOI :
10.1109/ICEMI.2009.5274837
Filename :
5274837
Link To Document :
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