DocumentCode
1568176
Title
Compendia of Radiation Test Results
Author
Layton, Phil ; Longden, Larry ; Patnaude, Ed
Author_Institution
Maxwell Technol. Inc, San Diego
Volume
0
fYear
2007
Firstpage
135
Lastpage
140
Abstract
TID and SEE data were taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed.
Keywords
digital-analogue conversion; dosimetry; integrated circuit testing; radiation effects; DAC; IC devices; IC testing; SEE; TID; die level total dose testing; digital-to-analog converter; natural space environment; radiation susceptibility; radiation testing; Annealing; Digital-analog conversion; Integrated circuit testing; Packaging; Performance analysis; Performance evaluation; Production; Software performance; Software testing; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location
Honolulu, HI
Print_ISBN
978-1-4244-1464-2
Type
conf
DOI
10.1109/REDW.2007.4342554
Filename
4342554
Link To Document