Title :
Compendia of Radiation Test Results
Author :
Layton, Phil ; Longden, Larry ; Patnaude, Ed
Author_Institution :
Maxwell Technol. Inc, San Diego
Abstract :
TID and SEE data were taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed.
Keywords :
digital-analogue conversion; dosimetry; integrated circuit testing; radiation effects; DAC; IC devices; IC testing; SEE; TID; die level total dose testing; digital-to-analog converter; natural space environment; radiation susceptibility; radiation testing; Annealing; Digital-analog conversion; Integrated circuit testing; Packaging; Performance analysis; Performance evaluation; Production; Software performance; Software testing; Temperature;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342554
