Title :
Single event effects hardening and characterization of honeywell´s pass 3 RHPPC processor integrated circuit
Author :
Lintz, John P. ; Hoffmann, Lee F. ; Smith, Matthew J. ; Van Cleave, Russell T. ; Cizmarik, Ryan R.
Author_Institution :
Honeywell Aerosp., Clearwater
Abstract :
We describe a single event effects evaluation of Honeywell´s radiation-hardened Pass 3 RHPPC processor, which is functionally and pin-compatible with the commercial PowerPC 603eTM. Results support an upset rate of 1x10-5 upsets/chip-day in geosynchronous orbit.
Keywords :
aerospace components; cosmic ray interactions; integrated circuit design; microprocessor chips; radiation hardening (electronics); space vehicles; Honeywell´s radiation-hardened Pass 3 RHPPC processor integrated circuit; PowerPC 603e; galactic cosmic ray environment; geosynchronous earth orbit; single event effects evaluation; Built-in self-test; Clocks; Cyclotrons; Electronics packaging; Microprocessors; Protons; Registers; Silicon on insulator technology; Single event upset; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342558
