Title :
Static Proton and Heavy Ion Testing of the Xilinx Virtex-5 Device
Author :
Quinn, Heather ; Morgan, Keith ; Graham, Paul ; Krone, Jim ; Caffrey, Michael
Author_Institution :
Los Alamos Nat. Lab., Los Alamos
Abstract :
This paper presents proton and heavy ion static results for the latest Xilinx field-programmable gate arrays (FPGAs). The paper analyzes static bit cross-sections, resources, multiple-bit upsets (MBUs) and angular effects.
Keywords :
field programmable gate arrays; proton effects; semiconductor device testing; FPGA; Xilinx Virtex-5 device; Xilinx field-programmable gate arrays; angular effects; heavy ion testing; multiple-bit upsets; proton testing; static bit cross-sections; Aerospace testing; Circuits; Cyclotrons; Digital signal processing; Field programmable gate arrays; Laboratories; Protons; Random access memory; Routing; Table lookup;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342561
