Title :
Neutron Induced Micro SEL Events in COTS SRAM Devices
Author :
Tausch, Jake ; Sleeter, David ; Radaelli, Daniele ; Puchner, Helmut
Author_Institution :
JD Instrum., Albuquerque
Abstract :
This paper provides experimental details of micro-latchup occurrences in SRAM circuitry caused by exposure to neutron irradiation similar to that seen at sea level (terrestrial neutrons). Design enhancements are identified that eliminated the problem.
Keywords :
SRAM chips; integrated circuit design; logic design; neutron effects; COTS SRAM devices; micro latchup occurrences; neutron induced micro SEL events; sea level irradiation; Atmosphere; Circuit testing; Error analysis; Ice; Neutrons; Prototypes; Random access memory; Sea level; Telephony; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342562
