• DocumentCode
    1568284
  • Title

    Neutron Induced Micro SEL Events in COTS SRAM Devices

  • Author

    Tausch, Jake ; Sleeter, David ; Radaelli, Daniele ; Puchner, Helmut

  • Author_Institution
    JD Instrum., Albuquerque
  • Volume
    0
  • fYear
    2007
  • Firstpage
    185
  • Lastpage
    188
  • Abstract
    This paper provides experimental details of micro-latchup occurrences in SRAM circuitry caused by exposure to neutron irradiation similar to that seen at sea level (terrestrial neutrons). Design enhancements are identified that eliminated the problem.
  • Keywords
    SRAM chips; integrated circuit design; logic design; neutron effects; COTS SRAM devices; micro latchup occurrences; neutron induced micro SEL events; sea level irradiation; Atmosphere; Circuit testing; Error analysis; Ice; Neutrons; Prototypes; Random access memory; Sea level; Telephony; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-1464-2
  • Type

    conf

  • DOI
    10.1109/REDW.2007.4342562
  • Filename
    4342562
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1568284