DocumentCode :
1568537
Title :
Dead Via Minimization by Simultaneous Routing and Redundant Via Insertion
Author :
Lin, Yen-Hung ; Yen-Hung Lin ; Su, Guan-Chan ; Li, Yih-Lang
Author_Institution :
Comput. Sci. Dept., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2010
Firstpage :
657
Lastpage :
662
Abstract :
While via failure significantly contributes to yield loss during manufacturing, post-routing redundant via insertion method is the conventional means of reducing the via failure rate, but only alive vias can be protected. As existing dead vias still lower manufacturing yield, identifying a routing result with fewer dead vias can increase the redundant via insertion rate, subsequently enhancing the yield of chips. This work presents, for the first time, a redundant-via-aware routing system to retain redundant via resources in track assignment, in which redundant vias are inserted in detailed routing. The proposed via prediction scheme performs trial route using L-shaped patterns to estimate via positions. Meanwhile, the proposed redundant-via-aware detailed router gradually relaxes the limitation on the number of generated dead vias during path searching to minimize the number of dead vias. Experimental results indicate that the proposed redundant-via-aware routing system is, to our knowledge, the first routing system that can achieve 100% redundant via insertion rate with all MCNC benchmark circuits.
Keywords :
circuit optimisation; integrated circuit design; integrated circuit interconnections; integrated circuit yield; network routing; MCNC benchmark circuit; dead via minimization; redundant via aware routing system; redundant via insertion; redundant via resource; simultaneous routing; track assignment; yield loss; Circuits; Computer aided manufacturing; Computer science; Costs; Design for manufacture; Manufacturing processes; Minimization methods; Protection; Routing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
Type :
conf
DOI :
10.1109/ASPDAC.2010.5419806
Filename :
5419806
Link To Document :
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