Title :
Neural-based smart CMOS sensors for on-line pattern classification applications
Author :
Djahanshahi, H. ; Jullien, G.A. ; Miller, W.C. ; Ahmadi, M.
Author_Institution :
Dept. of Electr. Eng., Windsor Univ., Ont., Canada
Abstract :
We review previous work on CMOS photoreceptors and neural-based smart sensors that are VLSI realization of a neural network classifier with an integrated photoreceptor array. These sensors are designed for on-line pattern classification applications requiring image capture or non-contact measurement. Photoreceptors are based on Field-Effect-Modified parasitic phototransistors in CMOS technology. Several designs have been implemented. A pre-programmed smart photosensor fabricated in 3 μ CMOS has been successfully tested and a programmable version has been fabricated in 1.2 μ. The latest design of smart sensor is based on a novel unified synapse-neuron building block that results in a highly modular, scalable and area-efficient VLSI architecture. A test circuit containing an 8×8 photosensitive array and a fully-connected programmable neural network with N=54 inputs, m=8 hidden neurons and k=4 output neurons has been designed in the 1.2 μ technology. Based on the new architecture synaptic density has been doubled, and we have been able to increase the size of the optical input array as well as neural classifier itself
Keywords :
CMOS integrated circuits; VLSI; image sensors; intelligent sensors; neural chips; pattern classification; 1.2 micron; 3 micron; CMOS photoreceptor; VLSI architecture; field-effect-modified parasitic phototransistor; image capture; integrated array; neural network; noncontact measurement; on-line pattern classification; pre-programmed circuit; programmable circuit; smart sensor; unified synapse-neuron; CMOS image sensors; CMOS technology; Circuit testing; Intelligent sensors; Neural networks; Neurons; Pattern classification; Photoreceptors; Sensor arrays; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3073-0
DOI :
10.1109/ISCAS.1996.541982