Title :
Is 3D integration an opportunity or just a hype?
Author :
Li, Jin-Fu ; Wu, Cheng-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Abstract :
Three-dimensional (3D) integration using through silicon via (TSV) is an emerging technology for integrated circuit designs. 3D integration technology provides numerous opportunities to designers looking for more cost-effective system chip solutions. In addition to stacking homogeneous memory dies, 3D integration technology supports heterogeneous integration of memories, logic, sensors, etc. It eases the interconnect performance limitation, provides higher functionality, results in small form factor, etc. On the other hand, there are challenges that should be overcome before volume production of TSV-based 3D ICs becomes possible, e.g., technological challenges, yield and test challenges, thermal and power challenges, infrastructure challenges, etc.
Keywords :
integrated circuit design; three-dimensional integrated circuits; 3D integration; cost-effective system; emerging technology; integrated circuit designs; through silicon via; Integrated circuit interconnections; Integrated circuit synthesis; Integrated circuit technology; Logic; Power system interconnection; Production; Silicon; Stacking; Testing; Through-silicon vias;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419826