Title :
Functional and partially-functional skewed-load tests
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Functional broadside tests were defined to address overtesting that may occur with unrestricted scan-based tests. However, the fault coverage achievable by functional broadside tests is lower than the fault coverage achievable by unrestricted scan-based tests. It was observed that skewed-load tests can improve the fault coverage achievable by unrestricted broadside tests. Motivated by these observations, we define functional (and partially-functional) skewed-load tests to improve the fault coverage of functional broadside tests while attempting to curb overtesting. We present experimental results to demonstrate the ability of functional skewed-load tests to improve the fault coverage without exceeding the maximum switching activity of functional broadside tests (which is one indication of potential overtesting).
Keywords :
fault diagnosis; integrated circuit testing; curb overtesting; fault coverage; functional broadside tests; maximum switching activity; partially-functional skewed-load tests; unrestricted scan-based tests; Circuit faults; Circuit testing; Cities and towns; Clocks; Electrical fault detection; Fault detection; Propagation delay; Signal design;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419832
