Title :
Second-level testing revisited and applications to NIST SP800-22
Author :
Pareschi, Fabio ; Rovatti, Riccardo ; Setti, Gianluca
Author_Institution :
ENDIF, Univ. of Ferrara, Ferrara
Abstract :
The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests.
Keywords :
cryptography; random number generation; random sequences; statistical testing; NIST SP800-22; RNG sequence; Type II error reduction; cryptography; random number generator; second-level testing; security requirement; Aggregates; Character generation; Cryptography; Data security; Distributed computing; Error probability; NIST; Random number generation; Random sequences; Testing;
Conference_Titel :
Circuit Theory and Design, 2007. ECCTD 2007. 18th European Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4244-1341-6
Electronic_ISBN :
978-1-4244-1342-3
DOI :
10.1109/ECCTD.2007.4529674