DocumentCode :
1569094
Title :
Patterned-electron-beam magnetic tomography technique for observing a magnetic field distribution generated by a magnetized material
Author :
Suzuki, H. ; Shimakura, T. ; Nakamura, K.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear :
2002
Abstract :
Summary form only given. We have previously reported a technique for mapping a magnetic field distribution over the air-bearing surface of a recording head, see Suzuki et al. (2000, 1998). This technique uses modified transmission electron microscopy and computer processing to produce a three-dimensional intensity profile of a magnetic head field. We demonstrate an improved magnetic sensitivity of this technique and us it to analyze a magnetic vector distribution generated by a sub-micrometer-square area of a magnetized material.
Keywords :
magnetic field measurement; magnetic heads; transmission electron microscopy; 3D intensity profile; air-bearing surface; computer processing; magnetic field distribution; magnetic head field; magnetic sensitivity; magnetic vector distribution; magnetized material; patterned-electron-beam magnetic tomography; recording head; transmission electron microscopy; Magnetic fields; Magnetic flux; Magnetic force microscopy; Magnetic heads; Magnetic materials; Magnetic separation; Magnetization; Magnetostatics; Probes; Tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1001098
Filename :
1001098
Link To Document :
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