Title :
A multi-rail shared error ADC with pipeline structure for DC-DC converter digital controller in 0.13µm CMOS technology
Author :
Ge, Fuding ; Trivedi, Malay ; Jiang, William ; Thomas, Brent
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
This paper presents the design and measurement results of an error ADC with a pipeline structure for DC-DC converter digital controller in 0.13μm technology. The proposed error ADC shared by three voltage rails through an analog MUX. The error signal is amplified by a differential amplifier and a switched capacitor amplifier with a total gain of 10. The amplified error signal is then digitized with a conventional 5b pipeline ADC. The ADC operates at a sampling frequency of 12 MSPS, draws 3mA from a single 1.5V power supply with an area of 500μm by 600μm. Metal fringe capacitors are used for switched-capacitor circuit.
Keywords :
CMOS integrated circuits; DC-DC power convertors; analogue-digital conversion; differential amplifiers; switched capacitor networks; 5b pipeline ADC; CMOS technology; DC-DC converter digital controller; analog MUX; current 3 mA; differential amplifier; metal fringe capacitors; multirail shared error ADC; pipeline structure; size 0.13 mum; size 500 mum; size 600 mum; switched capacitor amplifier; switched-capacitor circuit; voltage 1.5 V; CMOS technology; DC-DC power converters; Differential amplifiers; Digital control; Error correction; Pipelines; Rails; Sampling methods; Switched capacitor circuits; Voltage;
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-7771-5
DOI :
10.1109/MWSCAS.2010.5548552
