Title :
Sub-micron scale MOKE measurement system
Author :
Lancarotte, M.S. ; Schoenmaker, J. ; Nobrega, L.N. ; Souche, Y. ; Santos, A.D.
Author_Institution :
Inst. de Fisica, Sao Paulo Univ., Brazil
Abstract :
Summary form only given. Magnetic material technical applications are progressively being miniaturized. As a consequence, the research community needs to develop new instrumentation to study the magnetic properties in a sub-micron or nanoscopic scale. In this paper we present the development of a scanning near-field optical microscope (SNOM) devoted to the study of magnetic thin films. We have incorporated the capability of analyzing the light polarization to get magnetic information by means of the transverse magneto-optical Kerr effect (MO).
Keywords :
Kerr magneto-optical effect; magnetic thin films; near-field scanning optical microscopy; MOKE measurement system; SNOM; light polarization; magnetic properties; magnetic thin films; scanning near-field optical microscope; transverse magneto-optical Kerr effect; Information analysis; Instruments; Magnetic analysis; Magnetic films; Magnetic force microscopy; Magnetic materials; Magnetic properties; Nonlinear optics; Optical films; Optical microscopy;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001105
