Title :
A new approach to analysis and simulation of single and coupled low-loss interconnects.
Author :
Ligocka, Agnieszka ; Bandurski, Wojciech ; Rydlichowski, Piotr
Author_Institution :
Dept. of Multimedia Telecommun. & Microelectron., Poznan Univ. of Technol., Poznan
Abstract :
In the paper the new method of computing the threshold crossing times for the low-loss interconnect is presented. The interconnect output response is calculated using the multiple scales method with the perturbation parameter related to the line losses. From the derived formula, the analytical form for threshold crossing time is obtained. The algorithm that uses the step response calculations for two symmetric, coupled interconnects is also presented.
Keywords :
microprocessor chips; network analysis; coupled low-loss interconnects; interconnect output response; multiple scales method; step response calculations; threshold crossing time; Analytical models; Circuit simulation; Computational modeling; Coupling circuits; Inductance; Integrated circuit interconnections; Integrated circuit technology; Magnetic materials; Power system interconnection; Power transmission lines;
Conference_Titel :
Circuit Theory and Design, 2007. ECCTD 2007. 18th European Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4244-1341-6
Electronic_ISBN :
978-1-4244-1342-3
DOI :
10.1109/ECCTD.2007.4529683
