Title :
High resolution quantitative magnetic force microscopy
Author :
Hug, H.J. ; Kappenberger, P. ; Martin, Sebastien ; Reimann, Peter ; Hoffmann, Raik ; Rychen, J. ; Lu, Wenchao ; Guntherodt, H.-J.
Author_Institution :
Inst. fur Phys., Basel Univ., Switzerland
Abstract :
Summary form only given. The bit size in magnetic recording has reached the resolution limit of presently available magnetic force microscopes. The next generation of magnetic force microscopes are expected to measure the magnetic field quantitatively, obtain a lateral resolution below 10 nm, and achieve a complete separation between topographical and magnetic information.
Keywords :
magnetic field measurement; magnetic force microscopy; 10 nm; lateral resolution; magnetic field; magnetic force microscopy; magnetic imaging; quantitative measurement; topographic imaging; Calibration; Force measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic recording; Magnetic separation; Physics; Signal resolution; Surfaces;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001119
