DocumentCode :
1569484
Title :
A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits
Author :
Andrade, D. ; Calomarde, A. ; Rubio, A.
Author_Institution :
Univ. Politec. de Catalunya, Barcelona, Spain
fYear :
2010
Firstpage :
141
Lastpage :
144
Abstract :
Process variability and environmental fluctuations deeply affect the digital circuits performance in many different ways, one of them, the data processing time which may cause error on synchronous digital circuits due to underestimated time violations. This situation is commonly avoided adding time margins to the clock signal making it larger than nominal worst-case data process time, penalizing the global performance. In this paper a new mechanism for compensating both environmental fluctuations and process parameters variations effects on digital circuits is presented. The environmental compensation mechanism regenerates the clock signal for a pipelined system stages adding a compensated skew component depending on the local environmental conditions of every one of these stages. The process variations are corrected with a calibration circuit which adjusts the clock period in every stage taking into account its particular static deviations.
Keywords :
calibration; compensation; digital integrated circuits; logic circuits; calibration circuit; compensation technique; digital integrated circuit; environmental fluctuation; pipelined system stage; process variation; static deviation; synchronous digital circuit; Calibration; Clocks; Data processing; Digital circuits; Digital integrated circuits; Environmental factors; Fluctuations; Optical control; Temperature; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
ISSN :
1548-3746
Print_ISBN :
978-1-4244-7771-5
Type :
conf
DOI :
10.1109/MWSCAS.2010.5548578
Filename :
5548578
Link To Document :
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