Title :
Checkered White-RGB Color LOFIC CMOS image sensor
Author :
Kawada, Shun ; Sakai, Shin ; Tashiro, Yoshiaki ; Sugawa, Shigetoshi
Author_Institution :
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
Abstract :
We succeeded in developing a checkered White-RGB color CMOS image sensor based on a lateral overflow integration capacitor (LOFIC) architecture. The LOFIC CMOS image sensor with a 1/3.3-inch optical format, 1280H × 480V pixels, 4.2-¿m effective pixel pitch along with 45° direction was designed and fabricated through 0.18-¿m 2-Poly 3-Metal CMOS technology with buried pinned photodiode (PD) process. The image sensor has achieved about 108-¿V/- high conversion gain and about 102-dB dynamic range (DR) performance in one exposure.
Keywords :
CMOS image sensors; photodiodes; 2-poly 3-metal CMOS technology; LOFIC architecture; checkered white-RGB color LOFIC CMOS image sensor; lateral overflow integration capacitor; pinned photodiode process; CMOS image sensors; CMOS process; CMOS technology; Capacitors; Image converters; Image sensors; Optical design; Optical sensors; Photodiodes; Pixel;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419870
