Title :
Input common-mode voltage behaviour of CMOS bulk-driven differential stages
Author :
Carrillo, Juan M. ; Domínguez, Miguel A. ; Duque-Carrillo, J. Francisco ; Torelli, Guido
Author_Institution :
Dept. of Electron., Univ. of Extremadura, Badajoz, Spain
Abstract :
In this paper, the response of a bulk-driven MOS input stage is discussed and experimentally evaluated over the entire input common-mode voltage range. In particular, the behavior of the effective input transconductance and the input current is studied for different gate bias voltage conditions of the input transistors. A simple technique to automatically control the gate bias voltage of a bulk-driven differential pair is also presented so as to optimize the design tradeoff between the effective input transconductance and the input current. Experimental results, in standard 0.35-mum CMOS technology, validate the effectiveness of the proposed technique.
Keywords :
CMOS integrated circuits; MOSFET; CMOS bulk-driven differential stages; bulk-driven MOS input stage; bulk-driven differential pair; gate bias voltage condition; input common-mode voltage; input common-mode voltage behaviour; input current; input transconductance; input transistor; size 0.35 mum; Automatic voltage control; CMOS technology; Circuit noise; Design optimization; Electrodes; Fabrication; Low-noise amplifiers; MOSFETs; Noise reduction; Transconductance;
Conference_Titel :
Circuit Theory and Design, 2009. ECCTD 2009. European Conference on
Conference_Location :
Antalya
Print_ISBN :
978-1-4244-3896-9
Electronic_ISBN :
978-1-4244-3896-9
DOI :
10.1109/ECCTD.2009.5274938