Title :
An exact analysis of the impact of fading correlation on the average level crossing rate and average outage duration of selection combining
Author :
Yang, Lin ; Alouini, Mohamed-Slim
Author_Institution :
DEpt. of Electr. & Comput. Eng., Minnesota Univ., USA
Abstract :
This paper derives the average level crossing rate (LCR) and the average outage duration (AOD) of selection combining (SC) over correlated and/or unbalanced channels. More specifically, it presents a general approach for the analysis of such systems operating over correlated Rayleigh, Rician, and/or Nakagami fading channels. The general approach is then applied to obtain generic closed-form expressions for the LCR and AOD of dual-branch SC in a correlated Rayleigh and Nakagami fading environment. The results obtained as special cases of the offered generic closed-form expressions are compared to those previously reported in the literature. Finally, some numerical examples comparing the LCR and AOD of SC with various value of fading correlation, average fading power unbalance, and Nakagami parameter are provided and discussed.
Keywords :
Rayleigh channels; Rician channels; correlation theory; diversity reception; probability; Nakagami fading channel; Rayleigh fading channel; Rician fading channel; average level crossing rate; average outage duration; fading correlation impact; generic closed-form expressions; selection combining; unbalanced channels; Closed-form solution; Diversity reception; Fading; Frequency measurement; Length measurement; Mobile antennas; Power system modeling; Rayleigh channels; Rician channels; Time measurement;
Conference_Titel :
Vehicular Technology Conference, 2003. VTC 2003-Spring. The 57th IEEE Semiannual
Print_ISBN :
0-7803-7757-5
DOI :
10.1109/VETECS.2003.1207539