DocumentCode :
1569607
Title :
Checker-pattern and shared two pixels LOFIC CMOS image sensors
Author :
Tashiro, Yoshiaki ; Kawada, Shun ; Sakai, Shin ; Sugawa, Shigetoshi
Author_Institution :
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
fYear :
2010
Firstpage :
343
Lastpage :
344
Abstract :
Two wide dynamic range CMOS image sensors with lateral overflow integration capacitor have been developed. A checker-pattern image sensor has achieved high area efficiency by placing the color filters and on-chip microlens along the direction at an angle of 45°. A shared two pixels image sensor has achieved small pixel pitch by introducing a lateral overflow gate in each pixel. The fabricated image sensors exhibit high full well capacity, low noise, wide dynamic range and high resolution performance.
Keywords :
CMOS image sensors; capacitors; microlenses; optical filters; LOFIC CMOS image sensors; checker-pattern image sensor; color filters; lateral overflow integration capacitor; on-chip microlens; CMOS image sensors; Capacitors; Colored noise; Dynamic range; Filters; Image resolution; Image sensors; Lenses; Microoptics; Pixel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
Type :
conf
DOI :
10.1109/ASPDAC.2010.5419872
Filename :
5419872
Link To Document :
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