Title :
A performance-constrained template-based layout retargeting algorithm for analog integrated circuits
Author :
Liu, Zheng ; Zhang, Lihong
Author_Institution :
Fac. of Eng. & Appl. Sci., Memorial Univ. of Newfoundland, St. John´´s, NL, Canada
Abstract :
Performance of analog integrated circuits is highly sensitive to layout parasitics. This paper presents an improved template-based algorithm that automatically conducts performance-constrained parasitic-aware retargeting and optimization of analog layouts. In order to achieve desired circuit performance, performance sensitivities with respect to layout parasitics are first determined. Then the algorithm applies a piecewise-sensitivity model to control parasitic-related layout geometries by directly constructing a set of performance constraints subject to maximum performance deviation due to parasitics. The formulated problem is finally solved using graph-based techniques combined with mixed-integer nonlinear programming. The proposed method has been incorporated into a parasitic-aware automatic layout optimization and retargeting tool. It has been demonstrated to be effective and efficient especially when adapting layout design for new technologies or updated specifications.
Keywords :
analogue integrated circuits; integer programming; integrated circuit layout; nonlinear programming; analog integrated circuits; analog layout optimization; circuit performance; layout parasitics; layout retargeting algorithm; mixed integer nonlinear programming; parasitic-aware automatic layout optimization; parasitic-related layout geometries; performance-constrained parasitic-aware retargeting; performance-constrained template; piecewise-sensitivity model; template-based algorithm; Analog circuits; Analog integrated circuits; Automatic control; Circuit optimization; Design automation; Geometry; Integrated circuit interconnections; Parasitic capacitance; Performance gain; Solid modeling;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419880