Title :
A Trimming-Free CMOS Bandgap-Reference Circuit with Sub-1-V-Supply Voltage Operation
Author :
Okuda, Yuichi ; Tsukamoto, Takayuki ; Hiraki, Mitsuru ; Horiguchi, Masashi ; Ito, Takayasu
Author_Institution :
Renesas Technol. Corp., Tokyo
Abstract :
We propose a bandgap-reference circuit (BGR) that is very robust against voltage, temperature, and local device variations and features sub-l-V operation. The BGR achieves "3sigma = 2.5%" accuracy for local variation and operates at a 0.95-V-supply voltage.
Keywords :
CMOS integrated circuits; integrated circuit testing; large scale integration; low-power electronics; BGR fabrication; LSI; local device variation; sub-I-V operation; trimming-free CMOS bandgap-reference circuit; triple well CMOS process; voltage 0.95 V; CMOS process; Circuits; Diodes; Equations; Indium tin oxide; Low voltage; Operational amplifiers; Robustness; Temperature measurement; Testing;
Conference_Titel :
VLSI Circuits, 2007 IEEE Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-4-900784-05-5
Electronic_ISBN :
978-4-900784-05-5
DOI :
10.1109/VLSIC.2007.4342675
