Title :
Lattice distortion effects at grain boundaries in colossal magnetoresistive films
Author :
Yeong-Ah Soh ; Aeppli, G. ; Evans, P.G. ; Cai, Z. ; Lai, B. ; Mathur, N.D. ; Blamire, M.G. ; Kim, C.-Y. ; Isaacs, E.D.
Author_Institution :
NEC Res. Inst., Princeton, NJ, USA
Abstract :
Summary form only given. The role of strain on the magnetic and magnetotransport properties of colossal magnetoresistance (CMR) films has been reported widely both experimentally and theoretically and it is now a well accepted phenomenon. Depending on the lattice mismatch between the film and the substrate, strain on the film varies leading to a significant modulation of the Curie temperature T/sub c/. Using local probes - magnetic force microscopy (MFM) and X-ray microdiffraction - we have studied lattice distortion effects at grain boundaries in epitaxial manganite films. Our key result is that at the grain boundaries the lattice distortion is relaxed, resulting in a modification of the magnetic properties compared to the grain interior. Our results are in agreement with previous speculations of the existence of a magnetically or electronically distinct region at grain boundaries inferred from intergrain spin-polarized transport measurements.
Keywords :
Curie temperature; X-ray diffraction; colossal magnetoresistance; ferromagnetic materials; grain boundaries; internal stresses; lanthanum compounds; magnetic epitaxial layers; magnetic force microscopy; stress relaxation; strontium compounds; CMR; Curie temperature; LaSrMnO/sub 3/-SrTiO/sub 3/; MFM; SrTiO/sub 3/; X-ray microdiffraction; colossal magnetoresistive films; epitaxial manganite films; film-substrate lattice mismatch; grain boundaries; intergrain spin-polarized transport; lattice distortion effects; magnetic force microscopy; relaxation; strain effects; Colossal magnetoresistance; Grain boundaries; Lattices; Magnetic field induced strain; Magnetic films; Magnetic force microscopy; Magnetic properties; Probes; Substrates; Temperature dependence;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001144