DocumentCode :
1569889
Title :
Variable temperature MFM/EFM study of Pr-doped LCMO film
Author :
Chung, S.H. ; Shinde, S.R. ; Ogale, S.B. ; Venkatesan, T. ; Greene, R.L. ; Dreyer, M. ; Millis, A. ; Gomez, R.D.
Author_Institution :
Dept. of Phys., Maryland Univ., College Park, MD, USA
fYear :
2002
Abstract :
Summary form only given. The ferromagnetic perovskite manganites have tendencies towards phase separation into ferromagnetic-metallic and charge-ordered-insulating domains up to microns in size. We show that both ferromagnetic and charge-ordered domain structures can be detected by magnetic force microscopy (MFM) and electric force microscopy (EFM) operated at low temperatures below the Curie temperature (T/sub c/). The samples are 800 /spl Aring/ thick films of (La/sub 1-x/Pr/sub x/)/sub 0.67/Ca/sub 0.33/MnO/sub 3/ on LaAlO/sub 3/ [100] or SrTiO/sub 3/ [100] substrate with x=0.3-0.4 prepared using pulsed laser deposition. We will elaborate the microscopic electric and magnetic behaviors near the transition temperature and their relations to the macroscopic film character such as magnetization and resistivity.
Keywords :
Curie temperature; calcium compounds; electrical resistivity; ferromagnetic materials; lanthanum compounds; magnetic domains; magnetic force microscopy; magnetic structure; magnetic thin films; magnetisation; praseodymium compounds; (LaPr)/sub 0.67/Ca/sub 0.33/MnO/sub 3/; 800 A; Curie temperature; EFM; LaAlO/sub 3/; MFM; SrTiO/sub 3/; charge-ordered-insulating domains; electric force microscopy; ferromagnetic perovskite manganites; ferromagnetic-metallic domains; magnetic force microscopy; magnetic structure; magnetization; phase separation; pulsed laser deposition; resistivity; variable temperature MFM/EFM; Laser transitions; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic separation; Optical pulses; Pulsed laser deposition; Substrates; Temperature; Thick films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1001146
Filename :
1001146
Link To Document :
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