Title :
Extreme value statistics in silicon photonics
Author :
Borlaug, David ; Jalali, Bahram
Author_Institution :
Electr. Eng. Dept., UCLA, Los Angeles, CA
Abstract :
We show that fluctuations of Raman amplified pulses, in the presence of a noisy pump, follow extreme value statistics, and provide mathematical insight into the origin of this perplexing behavior.
Keywords :
Raman lasers; high-speed optical techniques; optical parametric oscillators; optical pumping; semiconductor lasers; silicon; statistical analysis; OPO; Raman amplified pulse fluctuation; Si; extreme value statistics; noisy pump; optical parametric oscillator; silicon photonics; Fluctuations; Laser excitation; Photonics; Pulse amplifiers; Pump lasers; Rician channels; Silicon; Statistical distributions; Statistics; Stimulated emission;
Conference_Titel :
IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
Conference_Location :
Acapulco
Print_ISBN :
978-1-4244-1931-9
Electronic_ISBN :
978-1-4244-1932-6
DOI :
10.1109/LEOS.2008.4688614
