Title :
Formal verification of Tunnel Diode Oscillator with temperature variations
Author :
Lata, Kusum ; Jamadagni, H.S.
Author_Institution :
Centre for Electron. Design & Technol., Indian Inst. of Sci., Bangalore, India
Abstract :
In this paper, we propose an extension to the formal verification approach of hybrid systems to verify the tunnel diode oscillator (TDO) with temperature variations. This enables the same platform that is used for validating the hybrid system, to be also used to formally verify the tunnel diode oscillator with temperature variations. The proposed approach utilizes the simulation traces from the actual implementation of the analog circuits to carry out the formal analysis and verification. We demonstrate our approach around checkmate and tunnel diode oscillator (TDO) as a case study. Current-voltage simulations were performed on a tunnel diode and the basic feature of the I-V characteristics were analyzed in the temperature range 100-300K. TDO is designed and validated based on these characteristics. In particular, TDO has been verified formally for the continuous range of initial conditions at this temperature range.
Keywords :
analogue integrated circuits; circuit simulation; formal verification; temperature; tunnel diode oscillators; I-V characteristics; TDO design; analog circuit; checkmate; current-voltage simulation; formal analysis; formal verification; hybrid system; temperature 100 K to 300 K; temperature variation; tunnel diode oscillator; Analog circuits; Analytical models; Automata; Circuit simulation; Circuit testing; Diodes; Formal verification; Oscillators; Performance analysis; Temperature distribution;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419891
