DocumentCode
1570036
Title
Energy and performance driven circuit design for emerging Phase-Change Memory
Author
Niu, Dimin ; Chen, Yibo ; Dong, Xiangyu ; Xie, Yuan
Author_Institution
Pennsylvania State Univ., University Park, PA, USA
fYear
2010
Firstpage
193
Lastpage
198
Abstract
Phase-Change Random Access Memory (PRAM) has become one of the most promising emerging memory technologies, due to its attractive features such as high density, fast access, non-volatility, and good scalability. The physical characteristics of a PRAM cell mainly depend on the material characteristic and the fabrication process. However, the access device and the operating voltage have significant impact on the PRAM performance, energy dissipation, and lifetime. In this paper, we study the design constraints for PRAM memory array, and propose design optimizations of the access device and the circuit operational voltage. The important features of PRAM memory, such as power consumption, read/write stability, speed, as well as lifetime are all considered as the constrained conditions in the proposed optimizations. Experimental results showed that the proposed methodology can provide a reliable design space for the access device and the operating voltage.
Keywords
integrated circuit design; integrated memory circuits; phase change memories; circuit design; energy dissipation; phase-change memory; phase-change random access memory; power consumption; read stability; write stability; Circuit synthesis; Design optimization; Energy dissipation; Fabrication; Memory management; Phase change memory; Phase change random access memory; Read-write memory; Scalability; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location
Taipei
Print_ISBN
978-1-4244-5765-6
Electronic_ISBN
978-1-4244-5767-0
Type
conf
DOI
10.1109/ASPDAC.2010.5419895
Filename
5419895
Link To Document