Title :
Signal generators for cost effective BIST of ADCs
Author :
Vasan, Bharath K. ; Duan, Jingbo ; Zhao, Chen ; Geiger, Randall L. ; Chen, Degang J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
Conventional approach to linearity testing of ADCs requires a signal generator that is more linear than the device under test (DUT). Recently introduced ADC testing algorithms dramatically relax the linearity requirements on the signal generator in exchange for maintaining a known functional relationship between two unknown nonlinear test signals. Simple signal generators that can be used to generate the two non-linear signals are discussed. Simulation results show that the generated signals can be used to test ADCs with resolution ranging between 6 and 17 bits.
Keywords :
analogue-digital conversion; built-in self test; signal generators; ADC linearity testing; ADC testing algorithm; built-in self test; cost effective BIST; nonlinear test signals; signal generator; Analog-digital conversion; Automatic testing; Built-in self-test; Costs; Data mining; Linearity; Signal design; Signal generators; Signal resolution; Voltage;
Conference_Titel :
Circuit Theory and Design, 2009. ECCTD 2009. European Conference on
Conference_Location :
Antalya
Print_ISBN :
978-1-4244-3896-9
Electronic_ISBN :
978-1-4244-3896-9
DOI :
10.1109/ECCTD.2009.5274967
