DocumentCode :
1570159
Title :
Co/Pt multilayers perpendicular magnetic recording media with thin Pt layers and high perpendicular anisotropy
Author :
Kawada, Yasuhide ; Ueno, Yukiko ; Shibata, Kenji
Author_Institution :
Device Technol. Lab., Fuji Electr. Corporate Res. & Dev. Ltd., Nagano, Japan
fYear :
2002
Abstract :
Summary form only given. It has been found that Co/Pt multilayers films have high perpendicular magnetic anisotropy when Co layer thickness is thicker than Pt layer one. The authors show that Hc increases with decreasing Pt layer thickness and has a maximum, 1.9 kOe at 0.13 nm for the samples of Pt underlayer/[Co(0.44 nm)/Pt(0/spl sim/1.2 nm)]/sub 20/ deposited by sputtering at 4 Pa Ar gas pressure. K/sub /spl perp// has also increased with decreasing Pt layer thickness, 3/spl times/10/sup 6/ to 10/spl times/10/sup 6/ erg/cm/sup 3/. They also show that Hc is large between 0.3 and 0.5 nm in Co layer thickness at 0.13 nm Pt layer thickness. Hc has increased with Co/Pt multilayers deposition Ar gas pressure and /spl alpha/(dM/dH at Hc) has decreased with Pt underlayer deposition Ar gas pressure. Increasing deposition pressures of Co/Pt multilayers and Pt underlayer to 7.5 Pa, the characteristics of Hc:4.7 kOe,S:0.96, Ms:800 emu/cm/sup 3/, /spl alpha/:4, K/sub /spl perp//: 10/spl times/10/sup 6/ erg/cm/sup 3/ have been obtained. And inserting FeTaC soft magnetic layer between glass substrate and Pt underlayer, those of Hc:5.8 kOe, S:0.87, /spl alpha/:1.8 have also been obtained. Grain size of Co/Pt multilayers has been 10 nm in diameter. Those characteristics imply that Co/Pt multilayers with thin Pt layer are very promising as perpendicular magnetic recording media of high recording density because of high K/sub /spl perp//, low noise and thin recording layer (less than 10 nm).
Keywords :
cobalt; grain size; magnetic multilayers; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum; sputtered coatings; 0.13 nm; 10 nm; Co-Pt; Co/Pt multilayers perpendicular magnetic recording media; FeTaC; FeTaC soft magnetic layer; Pt underlayer deposition; grain size; high perpendicular anisotropy; sputtering; thin Pt layers; Anisotropic magnetoresistance; Argon; Glass; Magnetic films; Magnetic multilayers; Nonhomogeneous media; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Soft magnetic materials; Sputtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1001159
Filename :
1001159
Link To Document :
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