• DocumentCode
    1570357
  • Title

    Study on self-ceasing met etching technology for mesa SiGe HBT

  • Author

    Jia, Sumei ; Yang, Ruixia

  • Author_Institution
    Sch. of Inf. Eng., Hebei Univ. of Technol., Tianjin, China
  • Volume
    1
  • fYear
    2011
  • Firstpage
    679
  • Lastpage
    681
  • Abstract
    Emitter mesa formation is most crucial in SiGe HBT fabrication. Because its base is so thin and etching velocity is so difficult to control that it is easy to damage external base surface for dry etching technology, self-ceasing wet etching is popular in fabricating emitter mesa SiGe HBT. This paper explores self-ceasing etching technology issues in fabricating SiGe HBT, including the select of etching solution and masking layers, the effects of temperature and ultrasonic power on etching velocity and uniformity, the optimum conditions are obtained. Finally, The SiGe HBT of current gainβ>;70 has been developed through using this technology.
  • Keywords
    Ge-Si alloys; etching; heterojunction bipolar transistors; semiconductor materials; SiGe; dry etching technology; emitter mesa HBT fabrication; etching velocity; masking layers; self-ceasing met etching technology; ultrasonic power; Etching; Fabrication; Silicon germanium; SiGe HBT; double mesa structure; self-ceasing wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cross Strait Quad-Regional Radio Science and Wireless Technology Conference (CSQRWC), 2011
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-9792-8
  • Type

    conf

  • DOI
    10.1109/CSQRWC.2011.6037043
  • Filename
    6037043