Title :
Using VXIbus-based products for RF test systems
Author_Institution :
Racal-Dana Instrum. Inc., Irvine, CA
Abstract :
VXIbus has received widespread acceptance as an excellent means of improving performance and downsizing automatic test and measurement systems. However, there has been some reluctance to adopt it for all applications, particularly high performance RF and microwave. The special areas of concern relating to RF and microwave issues and how VXIbus products can achieve the necessary performance are discussed. A description is given of the release of an RF chassis and RF prototyping card. These are low-noise, highly shielded designs which offer the user a new spectrum of potential VXIbus applications
Keywords :
automatic test equipment; computer interfaces; electromagnetic compatibility; electronic equipment testing; microwave measurement; EMC; RF chassis; RF prototyping card; RF test; VXIbus; automatic test; downsizing; noise; shielding; Automatic testing; Backplanes; Cooling; Electromagnetic compatibility; Immunity testing; Instruments; Manufacturing; Power supplies; Radio frequency; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
DOI :
10.1109/IMTC.1991.161528