Title :
Hot electron transport in 3-terminal devices based on magnetic tunnel junctions
Author :
Lacour, D. ; Hehn, M. ; Montaigne, Francois ; Jaffres, H. ; Rottlander, P. ; Nguyen, F. ; Van Dau ; Petroff, F. ; Schuhl, A.
Author_Institution :
Unite Mixte de Phys. CNRS Thales, Orsay, France
Abstract :
Summary form only given. Magnetic field-dependent electrical characteristics of magnetic tunnel junction-based 3-terminal devices have been measured on M/sub 1//I/sub 1//M/sub 2//I/sub 2//M/sub 3/ stacks where M are ferromagnetic electrodes and I are insulating barriers (Al/sub 2/O/sub 3/ or TaO). A spin polarised current is pumped from the voltage biased M/sub 1//I/sub 1//M/sub 2/ junction and injected in the I/sub 2//M/sub 3/ collector junction. The collected current in M/sub 3/ is then dependent on the voltages applied to each tunnel junction, the orientation of the electrode magnetisations and the thickness of the M/sub 2/ electrode. Besides the fundamental interest in measuring the properties of nonequilibrium spin-dependent hot electron transport, 3-terminal devices appear to be good candidates for a new generation of magnetic field-dependent devices. The control of hot electron transmission in a double tunnel junction is the keystone to ensure asymmetric diodes or hot electron magnetic field-dependent transistors. Experimental results have been compared to computations made in the framework of the parabolic band model.
Keywords :
MIM devices; MIM structures; charge injection; hot carriers; hot electron transistors; magnetic multilayers; magnetic tunnelling; spin polarised transport; triodes; 3-terminal devices; Al/sub 2/O/sub 3/; M/sub 1//I/sub 1//M/sub 2//I/sub 2//M/sub 3/ stacks; TaO; asymmetric diodes; collector junction; electrode magnetisation orientation; electrode thickness; ferromagnetic electrodes; hot electron magnetic field-dependent transistors; insulating barriers; magnetic tunnel junctions; nonequilibrium spin-dependent hot electron transport; parabolic band model; spin polarised injection; voltage biased M/sub 1//I/sub 1//M/sub 2/ junction; Dielectrics and electrical insulation; Electric variables; Electric variables measurement; Electrodes; Electrons; Magnetic devices; Magnetic field measurement; Magnetic tunneling; Polarization; Voltage;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001179