Title :
Main defects of LC-based ΣΔ modulators
Author :
Ashry, Ahmed ; Aboushady, Hassan
Author_Institution :
LIP6 Lab., Univ. of Pierre & Marie Curie, Paris, France
Abstract :
In this paper, the main defects of LC-based ΣΔ modulators due to process variations are presented. Resonance frequency shift of LC tank circuit, which was discussed is some publications, is shown to be one among many other possible defects that are discussed in this paper. The effect of each defect on modulator output spectrum is shown and discussed. It is suggested that the information extracted from the output spectrum can be used to calibrate the modulator main blocks.
Keywords :
modulators; sigma-delta modulation; LC tank circuit; LC-based ΣΔ modulator; modulator output spectrum; process variations; resonance frequency shift; Calibration; Degradation; Filters; Inductors; Q factor; RLC circuits; Radio frequency; Resonance; Resonant frequency; Transconductors;
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-7771-5
DOI :
10.1109/MWSCAS.2010.5548654
