Title :
Temperature dependent domain investigations on exchange biased NiFe/IrMn and CoFe/IrMn systems
Author :
Seidel, R. ; de Haas, O. ; Schultz, Ludwig ; Schaefer, Rudolf ; Ruehrig, M. ; Wecker, J.
Author_Institution :
IFW-Dresden, Dresden, Germany
Abstract :
Summary form only given. For tunneling magnetoresistance (TMR) sensor applications, the magnetic properties of both, the soft magnetic detection layer and of the hard magnetic reference layer, have to be optimized. For the reference layer either artificial antiferromagnet (AAF) subsystems, exchange biased magnetic layers or a combination of the two are commonly used. In this work we studied the magnetic microstructure and magnetization processes of sputtered IrMn/Permalloy, IrMn/CoFe and IrMn/CoFe-AAF systems by Kerr microscopy and magneto-optical magnetometry in a temperature range between 0/spl deg/ and 400/spl deg/C. A vacuum heating stage in the microscope allowed the in-situ setting of exchange bias by heating and cooling through the blocking temperature.
Keywords :
Kerr magneto-optical effect; Permalloy; cobalt alloys; exchange interactions (electron); iridium alloys; iron alloys; magnetic domains; magnetic multilayers; magnetisation; manganese alloys; sputtered coatings; 0 to 400 degC; IrMn-CoFe; IrMn-NiFe; Kerr microscopy; artificial antiferromagnet; blocking temperature; domain structure; exchange bias; hard magnetic reference layer; magnetic microstructure; magnetic properties; magnetization; magneto-optical magnetometry; soft magnetic detection layer; sputtered IrMn/Permalloy system; temperature dependence; tunneling magnetoresistance sensor; Antiferromagnetic materials; Heating; Magnetic domains; Magnetic properties; Magnetic sensors; Micromagnetics; Soft magnetic materials; Temperature dependence; Temperature sensors; Tunneling magnetoresistance;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001205
