DocumentCode
1571010
Title
A novel sensitivity analysis technique for VLSI statistical design
Author
Yan, Hing ; Su, Hua ; Ismail, Mahamod
Author_Institution
Intel Corp., Folsom, CA, USA
Volume
4
fYear
1996
Firstpage
485
Abstract
A sensitivity analysis technique, which is derived from the two factorial design for experiment technique and a recently reported flexible statistical model, is presented. This technique detects the sensitivity of the performance of interest to random device parameter variations. It identifies the most sensitive transistors and quantifies the effect. The reliability of this technique is verified by Monte Carlo simulation
Keywords
Monte Carlo methods; VLSI; analogue integrated circuits; circuit CAD; circuit analysis computing; design of experiments; digital simulation; integrated circuit design; network parameters; sensitivity analysis; statistical analysis; Monte Carlo simulation; VLSI; design for experiment technique; flexible statistical model; random device parameter variations; sensitivity analysis technique; statistical design; Acquired immune deficiency syndrome; Circuit simulation; Design for experiments; Equations; MOSFETs; Mirrors; Monte Carlo methods; Sensitivity analysis; Statistics; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-3073-0
Type
conf
DOI
10.1109/ISCAS.1996.542006
Filename
542006
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