Title :
A composition-aware model for unreliable circuits
Author_Institution :
Coll. of Inf. Technol., United Arab Emirates Univ., Al-Ain, United Arab Emirates
Abstract :
As the integrated circuit geometries shrink, it becomes important for the designers to take into consideration the reliability of the circuits. Different techniques can be used for reliability calculation or estimation. Some of the techniques are accurate but time-consuming while others are quick but may not be accurate enough. This work presents a model for calculating reliability (represented by probability of failure) as a function of circuit composition, such as, number of inputs and numbers of different types of gates, etc. The model is based on data collected from the simulations of a large number of combinational circuits.
Keywords :
circuit simulation; combinational circuits; estimation theory; integrated circuit design; integrated circuit reliability; circuit composition; circuit reliability; combinational circuits; composition-aware model; integrated circuit geometry; reliability calculation; reliability estimation; unreliable circuits; Circuit simulation; Educational institutions; Equations; Information technology; Integrated circuit modeling; Integrated circuit reliability; Manufacturing processes; Nanoscale devices; Neural networks; Solid modeling; Reliability estimation; failure probability; nano-metric circuits; neural network model; reliability model;
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-7771-5
DOI :
10.1109/MWSCAS.2010.5548673
