• DocumentCode
    1571263
  • Title

    High density patterned quantum dot arrays fabricated by electron beam lithography and wet chemical etching

  • Author

    Verma, V.B. ; Coleman, J.J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng, Univ. of Illinois at Urbana-Champaign, Wright, FL
  • fYear
    2008
  • Firstpage
    431
  • Lastpage
    432
  • Abstract
    The self-assembly method of forming QDs, although well established as a reliable growth technique, does not allow explicit control over the size and position of each QD. The large size variation of these QDs typically results in significant inhomogeneous broadening, diminishing the potential advantages of their use in optoelectronic devices such as low threshold current density, narrow gain bandwidth, and increased characteristic temperature [1]. Furthermore, the ability to control both the position and spectral properties of a single QD is of great importance for the next generation of nanophotonic devices integrating photonic crystal nanocavities with single QD emitters, which have potential applications in quantum optics and cavity quantum electrodynamics.
  • Keywords
    electron beam lithography; etching; integrated optics; nanopatterning; nanophotonics; optoelectronic devices; quantum dots; quantum electrodynamics; quantum optics; cavity quantum electrodynamics; electron beam lithography; high density patterned quantum dot array; nanophotonic device; photonic crystal nanocavity; quantum optics; wet chemical etching; Chemicals; Electron beams; Lithography; Nanoscale devices; Optoelectronic devices; Quantum dots; Self-assembly; Size control; Temperature control; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
  • Conference_Location
    Acapulco
  • Print_ISBN
    978-1-4244-1931-9
  • Electronic_ISBN
    978-1-4244-1932-6
  • Type

    conf

  • DOI
    10.1109/LEOS.2008.4688675
  • Filename
    4688675