Title :
Accuracy of the criticality probabilty of a path in statistical timing analysis
Author :
Tsukiyama, Shuji ; Fukui, Masahiro
Author_Institution :
Dept. of Electr., Electron., & Comm. Eng., Chuo Univ., Tokyo, Japan
Abstract :
In order to establish statistical design methodologies for LSI design, not only the statistical static timing analysis but also the delay fault detection and the circuit optimization are to be executed in statistical manners. In order to devise algorithms for these problems, the definitions of statistical criticalities are important, and the criticality probability of a path, which is the probability for the delay of the path to be largest among all paths, is one of the basic concepts of such criticalities. In this paper, we propose an O(nm)-time algorithm to compute the criticality probability for a given path precisely, where n and m are the numbers of vertices and edges of a given circuit graph, respectively. Then, we evaluate the accuracy of the criticality probability by comparing with Monte Carlo simulations. The experimental results show that the obtained probabilities are useful for the ranking of paths, if a given circuit does not have many equal delay critical paths.
Keywords :
circuit optimisation; fault diagnosis; graph theory; integrated circuit design; large scale integration; probability; statistical analysis; LSI design; Monte Carlo simulation comparison; O(nm)-time algorithm; circuit graph; circuit optimization; criticality probability accuracy; delay critical path; delay fault detection; statistical design methodologies; statistical static timing analysis; Circuit optimization; Delay; Design methodology; Electrical fault detection; Large scale integration; Pins; Probability; Random variables; Timing; Very large scale integration;
Conference_Titel :
Circuit Theory and Design, 2009. ECCTD 2009. European Conference on
Conference_Location :
Antalya
Print_ISBN :
978-1-4244-3896-9
Electronic_ISBN :
978-1-4244-3896-9
DOI :
10.1109/ECCTD.2009.5275076