Case studies in on-chip BIST for high-frequency circuits and systems

This paper describes the requirements and practical methods for on-chip built-in self-test (BIST) for high-frequency circuits and systems, considering input signal generation, measurement methods, and decision-making methods. Selected case studies in BIST designs for RF low-noise amplifiers and PLL jitter testing will be presented, with a focus on time-domain digital implementations for robustness and scalability.