Title :
Case studies in on-chip BIST for high-frequency circuits and systems
Author :
Soma, Mani ; Wang, Qi ; Ichiyama, K. ; Ishida, M. ; Yamaguchi, T.J.
Author_Institution :
Electr. Eng., Univ. of Washington, Seattle, WA, USA
Abstract :
This paper describes the requirements and practical methods for on-chip built-in self-test (BIST) for high-frequency circuits and systems, considering input signal generation, measurement methods, and decision-making methods. Selected case studies in BIST designs for RF low-noise amplifiers and PLL jitter testing will be presented, with a focus on time-domain digital implementations for robustness and scalability.
Keywords :
built-in self test; jitter; phase locked loops; radiofrequency amplifiers; time-domain analysis; PLL jitter testing; RF low-noise amplifiers; decision-making method; high-frequency circuits; input signal generation; measurement method; on-chip built-in self-test; time-domain digital implementation; Built-in self-test; Circuit testing; Circuits and systems; Decision making; Jitter; Low-noise amplifiers; Phase locked loops; Radio frequency; Signal generators; System-on-a-chip;
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-7771-5
DOI :
10.1109/MWSCAS.2010.5548730
