Millimeter-wave BiST and BiSC using a high-definition sub-ranged detector in 90nm CMOS

A wideband CMOS mm-Wave amplitude detector for on-chip self-test and calibration is presented. The high-conversion-gain detector enables accurate on-chip amplitude measurements and allows for the prediction of key RF parameters. The detector operates across the 60 GHz band and achieves a dynamic range of 0-0.5 V and a sensitivity of -9 V/V. The detector´s practical use in mm-wave Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC) circuits is demonstrated using a 60 GHz CMOS LNA. Simulation results show that the LNA gain, compression point, and intermodulation distortion are predicted with minimal error. The detector and LNA are built in IBM´s 90 nm CMOS technology.