• DocumentCode
    1573040
  • Title

    Image registration using feature points, Zernike moments and an M-estimator

  • Author

    Gillan, Steven ; Agathoklis, Pan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Victoria, Victoria, BC, Canada
  • fYear
    2010
  • Firstpage
    434
  • Lastpage
    437
  • Abstract
    This paper presents recent improvements in a feature based image registration technique. This image registration technique is based on finding a set of feature points in the two images and using these feature points for registration. This is done in four steps. In the first, images are filtered with the Mexican hat wavelet to obtain the feature point locations. In the second, the Zernike moments of neighbourhoods around the feature points are calculated and compared in the third step to establish correspondence between feature points in the two images and in the fourth the transformation parameters between images are obtained using an iterative least squares technique to eliminate outliers. The proposed method is illustrated with examples of images with partial overlap, differences in scale, various affine distortions and contamination with noise.
  • Keywords
    image registration; iterative methods; least squares approximations; wavelet transforms; M-estimator; Mexican hat wavelet; Zernike moments; feature point locations; feature points; image registration; iterative least squares technique; transformation parameters; Contamination; Feature extraction; Fourier transforms; Image analysis; Image registration; Iterative algorithms; Least squares methods; Mutual information; Parameter estimation; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
  • Conference_Location
    Seattle, WA
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-7771-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2010.5548757
  • Filename
    5548757