DocumentCode :
1573040
Title :
Image registration using feature points, Zernike moments and an M-estimator
Author :
Gillan, Steven ; Agathoklis, Pan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Victoria, Victoria, BC, Canada
fYear :
2010
Firstpage :
434
Lastpage :
437
Abstract :
This paper presents recent improvements in a feature based image registration technique. This image registration technique is based on finding a set of feature points in the two images and using these feature points for registration. This is done in four steps. In the first, images are filtered with the Mexican hat wavelet to obtain the feature point locations. In the second, the Zernike moments of neighbourhoods around the feature points are calculated and compared in the third step to establish correspondence between feature points in the two images and in the fourth the transformation parameters between images are obtained using an iterative least squares technique to eliminate outliers. The proposed method is illustrated with examples of images with partial overlap, differences in scale, various affine distortions and contamination with noise.
Keywords :
image registration; iterative methods; least squares approximations; wavelet transforms; M-estimator; Mexican hat wavelet; Zernike moments; feature point locations; feature points; image registration; iterative least squares technique; transformation parameters; Contamination; Feature extraction; Fourier transforms; Image analysis; Image registration; Iterative algorithms; Least squares methods; Mutual information; Parameter estimation; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
ISSN :
1548-3746
Print_ISBN :
978-1-4244-7771-5
Type :
conf
DOI :
10.1109/MWSCAS.2010.5548757
Filename :
5548757
Link To Document :
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