DocumentCode
1573345
Title
A single-eletron bandpass digital wave filter
Author
Yasuno, Takashi ; Suzuki, Yoshinao ; Fujisaka, Hisato ; Kamio, Takeshi ; Ahn, Chang-Jun ; Haeiwa, Kazuhisa
Author_Institution
Fac. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
fYear
2009
Firstpage
882
Lastpage
885
Abstract
This paper presents a sigma-delta domain bandpass digital filter built by using single-electron tunneling (SET) devices. The filter is a spatiotemporally discretized and binary quantized model of analog distributed parameter filters. The discretized and quantized model naturally has local connection structure and fault tolerance of transient device errors. Thus the filter architecture is suitable for nanoelectronic circuit implementation. We confirmed the frequency response characteristics and evaluated the fault tolerance by numerical simulation and with SET circuit simulator SIMON. The fault tolerance performance is that the filter keeps output SNR over 30 dB at the device error rate lower than 10-4 when oversampling ratio is 210.
Keywords
band-pass filters; circuit simulation; digital filters; fault tolerance; frequency response; nanoelectronics; numerical analysis; sigma-delta modulation; spatiotemporal phenomena; tunnelling; SET circuit simulator; SIMON; analog distributed parameter filters; binary quantized model; fault tolerance performance; frequency response characteristics; nanoelectronic circuit implementation; numerical simulation; sigma-delta domain bandpass digital filter; single-electron bandpass digital wave filter architecture; single-electron tunneling device; spatiotemporally discretized filter; transient device errors; Band pass filters; Circuit simulation; Delta-sigma modulation; Digital filters; Error analysis; Fault tolerance; Frequency response; Numerical simulation; Spatiotemporal phenomena; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuit Theory and Design, 2009. ECCTD 2009. European Conference on
Conference_Location
Antalya
Print_ISBN
978-1-4244-3896-9
Electronic_ISBN
978-1-4244-3896-9
Type
conf
DOI
10.1109/ECCTD.2009.5275126
Filename
5275126
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