DocumentCode :
1573345
Title :
A single-eletron bandpass digital wave filter
Author :
Yasuno, Takashi ; Suzuki, Yoshinao ; Fujisaka, Hisato ; Kamio, Takeshi ; Ahn, Chang-Jun ; Haeiwa, Kazuhisa
Author_Institution :
Fac. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
fYear :
2009
Firstpage :
882
Lastpage :
885
Abstract :
This paper presents a sigma-delta domain bandpass digital filter built by using single-electron tunneling (SET) devices. The filter is a spatiotemporally discretized and binary quantized model of analog distributed parameter filters. The discretized and quantized model naturally has local connection structure and fault tolerance of transient device errors. Thus the filter architecture is suitable for nanoelectronic circuit implementation. We confirmed the frequency response characteristics and evaluated the fault tolerance by numerical simulation and with SET circuit simulator SIMON. The fault tolerance performance is that the filter keeps output SNR over 30 dB at the device error rate lower than 10-4 when oversampling ratio is 210.
Keywords :
band-pass filters; circuit simulation; digital filters; fault tolerance; frequency response; nanoelectronics; numerical analysis; sigma-delta modulation; spatiotemporal phenomena; tunnelling; SET circuit simulator; SIMON; analog distributed parameter filters; binary quantized model; fault tolerance performance; frequency response characteristics; nanoelectronic circuit implementation; numerical simulation; sigma-delta domain bandpass digital filter; single-electron bandpass digital wave filter architecture; single-electron tunneling device; spatiotemporally discretized filter; transient device errors; Band pass filters; Circuit simulation; Delta-sigma modulation; Digital filters; Error analysis; Fault tolerance; Frequency response; Numerical simulation; Spatiotemporal phenomena; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuit Theory and Design, 2009. ECCTD 2009. European Conference on
Conference_Location :
Antalya
Print_ISBN :
978-1-4244-3896-9
Electronic_ISBN :
978-1-4244-3896-9
Type :
conf
DOI :
10.1109/ECCTD.2009.5275126
Filename :
5275126
Link To Document :
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