Title :
Totally self-checking checker modules revisited
Author :
Balasubramanian, P. ; Prasad, K.
Author_Institution :
Sch. of Comput. Sci., Univ. of Manchester, Manchester, UK
Abstract :
In this paper, conventional gate-level circuit compositions of the totally self-checking two-rail checker unit and the 2-of-4 checker unit are revisited. With respect to the former (latter), when the two input code words compared is not complementary (if two 1´s are not present in the four input rails) and in the presence of an internal stuck-at fault, the checker is no more fault secure. In both the cases, the checker ceases to be totally self-checking. Given this, we suggest suitable cell based designs to overcome the above drawbacks. Hence, this work presents a new insight into combinational checker circuits.
Keywords :
fault diagnosis; logic circuits; 2-of-4 checker; cell based designs; combinational checker circuits; conventional gate-level circuit compositions; internal stuck-at fault; totally self-checking checker modules; totally self-checking two-rail checker unit; Built-in self-test; Circuit faults; Computer errors; Computer science; Electrical fault detection; Error correction; Error correction codes; Fault detection; Rails; Railway engineering;
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-7771-5
DOI :
10.1109/MWSCAS.2010.5548772
