Title :
Planar Interconnect Technology for Power Module System Integration
Author :
Weidner, K. ; Kaspar, M. ; Seliger, N.
Author_Institution :
Corp. Technol., Siemens AG, Munich, Germany
Abstract :
The recent developments in power semiconductor devices and increasing demands on reliability as well as on operation performance require innovative package technologies. Such a novel package technique based on a Planar Interconnect Technology (SiPLIT®) for power modules is introduced in this work. This package features thick Cu interconnects on a high-reliable insulating film for power semiconductor chip top contacts. Due to the conductor structure and contact technology, on-resistance and stray inductances are very low compared to state-of-the-art Al wire bonds. In addition, large area contacting improves the power cycling capability and surge current robustness significantly. These remarkable properties have been verified on several prototype modules where the manufacturing process has also been optimised in terms of cost-effectiveness, system integration and maturity for series production.
Keywords :
electronics packaging; power electronics; semiconductor device reliability; SiPLIT; innovative package; planar interconnect technology; power cycling capability; power module system integration; power semiconductor devices; reliability; Copper; Films; Integrated circuit interconnections; Multichip modules; Reliability; Wires;
Conference_Titel :
Integrated Power Electronics Systems (CIPS), 2012 7th International Conference on
Conference_Location :
Nuremberg
Print_ISBN :
978-3-8007-3414-6